Rudolph Research / AutoEL III Ellipsometer III2A4C 1984

Description

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Rudolph Research / AutoEL III Ellipsometer III2A4C 1984
The Rudolph Ellipsometer AutoELIII allows measurement of the thickness and refractive index of one or two thin transparent films on a substrate.
Features:
Internal data reduction software for single and double layer transparent films.
SECS II Interface
Built in printer.
Specifications:
Maximum wafersize: 150 mm
633 nm wavelength
6in dia. quickload stage
Measuring time 17 to 50 seconds
Sample stage: movement X/Y
Condition and Testing
Device has been tested and is in working condition as of Feb 2013.
Device last powered on as of March 2021.
Device has been in climate controlled storage since Feb 2013, until March 2021 at 16C <30% humidity.
Device was used in a Research and Development Laboritory.
The unit has been used but still appears to be in good condition with minor scratches and scuff marks from normal wear and tear.
Contact us
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Offers are welcome!
Returns Not Accepted